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SN74BCT8374ADWR

Name: SN74BCT8374ADWR
Brand: SN74BCT8374ADWR
SKU: SN74BCT8374ADWR
Rating: 4.8 (144 reviews)

manufacturer:

Texas Instruments

Description:

IC SCAN TEST DEVICE W/FF 24-SOIC

Category:

Logic

Specifications

Category:

Integrated Circuits (ICs) Logic Specialty Logic

Number Of Bits:

Product Status:

Obsolete

Mounting Type:

Surface Mount

Package:

Tape & Reel (TR)

Series:

74BCT

Logic Type:

Scan Test Device With D-Type Edge-Triggered Flip-Flops

Supplier Device Package:

24-SOIC

Mfr:

Texas Instruments

Operating Temperature:

0°C ~ 70°C

Supply Voltage:

4.5V ~ 5.5V

Package / Case:

24-SOIC (0.295", 7.50mm Width)

Base Product Number:

74BCT8374

Introduction

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

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Stock:

MOQ:

Address: Fuhai Street, Baoan District, Shenzhen , Guangdong Province

E-mail: sales@ics-component.com

Phone: 86--13612807580

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SN74BCT8374ADWR

Integrated Circuits (ICs)

Specialized ICs

Audio Special Purpose

Clock/Timing

Data Acquisition

Embedded

Interface

Logic

Memory