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SN74BCT8373ANT

manufacturer:
Texas Instruments
Description:
IC SCAN TEST DEVICE LATCH 24-DIP
Category:
Logic
Specifications
Category:
Integrated Circuits (ICs) Logic Specialty Logic
Number Of Bits:
8
Product Status:
Obsolete
Mounting Type:
Through Hole
Package:
Tube
Series:
74BCT
Logic Type:
Scan Test Device With D-Type Latches
Supplier Device Package:
24-PDIP
Mfr:
Texas Instruments
Operating Temperature:
0°C ~ 70°C
Supply Voltage:
4.5V ~ 5.5V
Package / Case:
24-DIP (0.300", 7.62mm)
Base Product Number:
74BCT8373
Introduction
Scan Test Device with D-Type Latches IC 24-PDIP
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